| RefNo | EC/1976/38 |
| Previous numbers | Cert XX, 38; A55923 |
| Level | Item |
| Title | Whelan, Michael John: certificate of election to the Royal Society |
| Date | 1969 |
| Description | Citation typed |
| Citation | Distinguished for his outstanding pioneering work in developing the transmission electron microscopy technique for the study of defects in crystals. He was responsible both for establishing many of the basic experimental techniques, and for the theories of image contrast essential for the detailed interpretation of the micrographs. His treatment of image contrast from a stacking fault based on the dynamical theory of electron diffraction forms the basis of all subsequent work on image contrast from defects. Together with Howie he was responsible for developing the theory of image contrast from dislocations, and he has also made important contributions to the understanding of absorption and inelastic scattering of electrons in crystals. More recently, he pioneered the development of a combined electron microscope and energy analyser for carrying our microanalysis on a very fine scale. His electron microscope study of dislocation reactions in face centred cubic metals, established and extended an important aspect of dislocation theory; he also developed the first direct method for measuring stacking fault energy (from the curvature of dislocations at nodes) and together with Silcox he made the first direct observations of climb of dislocations. |
| AccessStatus | Closed |
Fellows associated with this archive
| Code | PersonName | Dates |
| NA2094 | Whelan; Michael John; physicist | |